Introduction
Scanning Electron Microscope (SEM) is a type of an electron microscope that images the sample surface by scanning with an electron beam. The electrons interact with the atoms that make up the sample-producing signals, such as Secondary Electron (SE), Backscattered Electron (BSE), and characteristic x-rays that contain information about the sample's surface morphology, topography, composition, and other properties.




Features
- Easy and fast scanning electron microscope
- Reasonable price and high performance
- Higher magnification and resolution compared to desktop SEM
- User-friendly software
- Convenient image processing
- Recipe-saving
- Various automated functions
- Compatible with EDS, BSE, and WDS
- A large chamber, eucentric, motor-drive stage option
- Navigation and low-vacuum option
- Motorized stage option
- Customizations available




Applications
- Life science
- TextilesFood
- Industry
- Material science
- Cosmetics
- Semiconductor
- Healthcare
- Education
- Chemical Industry


Specifications
* Performance